bcptestsi.h
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#ifndef __BCPTESTSI_H__
#define __BCPTESTSI_H__
/*************************************************************************
*
* File: bcptestsi.h
*
* This file contains test routine prototypes for the BCP Serial Interface (SI).
*
*/
int
SiTestRandEnv (int testid, char* arg1, char* arg2, int seed);
/* The following are exported to allow them to be invoked from a .tst file
* Inspect code in bcptestsi.c for the meaning of the arguments
* The seed argument is only used by the test if it is non-zero.
* If the seed argument is non-zero, it will overide any other
* mechanism for obtaining a seed.
*/
int
SiRunTests (int tests, int tests2, int levels, int seed);
int
SiTestValidCtrlCmds (int levels, int extra2, int extra3, int seed);
int
SiTestInvalidCtrlrCmds (int levels, int extra2, int extra3, int seed);
int
SiTestCtrlrErrViaBD (int levels, int cmd, int extra3, int seed);
int
SiTestDmaBusyError (int levels, int reg_to_write, int data, int xz_part);
int
SiTestSingleCmdDetection (int levels, int sgl_err_bit, int extra3, int seed);
int
SiTestJChannelReset (int levels, int extra2, int extra3, int seed);
int
SiTestDmaSpecificAddrs (int levels, int read_addrs, int extra3, int seed);
int
SiTestDmaWalkBits (int levels, int read_addrs, int walk_zeros, int seed);
int
SiTestRandom (int num_tests, int forced_fail, int fail_param, int seed);
int
SiTestLCtrlJSRST (int levels, int extra2, int extra3, int seed);
int
SiTestLCtrlButRate (int levels, int num_samples, int random_rates, int seed);
int
SiTestLCtrlJsxy (int levels, int jitter, int extra3, int seed);
#endif /* __BCPTESTSI_H__ */